Advanced Electron Nanoscopy (GAeN)

Institut Català de Nanociència i Nanotecnologia

General information

Department
Acronym
ICN2
Address
Campus UAB. Edifici ICN2
Postal Code
08193
City
Bellaterra
Contact
Jordi Arbiol
Position
ICREA Professor
Email
arbiol@icrea.cat
Alt. email
arbiol@icrea.cat
Website
https://gaen.cat/

Organization profile

Year Established
2013
Employees
300
ORCID
0000-0002-0695-1726
ResearchGate
https://www.researchgate.net/profile/Jordi-Arbiol/
Google Scholar
https://scholar.google.com/citations?user=6x6yJQkAAAAJ&hl=ca

Main research areas

Nanochemistry, Nanoelectronics/Molecular electronics, Nanomaterials, Nanoparticles, Other

Other: Electron Microscopy

Main research and technological activities

We are dedicated to advancing the understanding of nanomaterials through cutting-edge electron microscopy and related spectroscopy techniques.

Our research focuses on unraveling the structure–property relationships in nanomaterials designed for physical applications, including photonics, plasmonics, phononics, electronics, spintronics and quantum technologies.

To push the boundaries of materials characterization, we integrate AI-based methodologies, such as deep learning and machine learning, enabling advanced and automated data analysis at unprecedented scales.

We also explore the behavior of nanomaterials for energy and environmental applications, aiming to understand their dynamics down to the atomic level. Our group develops in-situ and correlative approaches that combine electron microscopy, synchrotron techniques, and artificial intelligence (AI) to provide holistic insights into material performance and evolution.

Patents and technology transfer

Active Patents
Patents Filed During Last 5 Years
Licensing Agreements
Spin-offs Created

Services offered

Available instruments and equipment

Equipment Name Model Manufacturer Year Open Access
No equipment registered.